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Results for: IEEE transactions on pattern analysis and machine intelligence

Sub-pixel edge extraction using the local energy model

M. Kisworo, S. Venkatesh, G. West

1994 / Vol. 16, pp. 405 - 410 / IEEE transactions on pattern analysis and machine intelligence

Early jump-out corner detectors

J. Cooper, S. Venkatesh, L. Kitchen

1993 / Vol. 15, pp. 823 - 828 / IEEE transactions on pattern analysis and machine intelligence