Results for:

Automated Visual Inspection, a Computer Vision Approach

M. Kisworo, W. G, S. Venkatesh

1991 / South East Asia Computer Conference

2-D Edge Feature Extraction to Subpixel Accuracy Using the Generalized Energy Approach

M. Kisworo, S. Venkatesh, G. West

1991 / pp. 344 - 348 / 10 International Conference on EC3-Energy, Computer, Communication and Control Systems

Planning with Events and States

D. Kieronska, S. Venkatesh, C. P. Tsang

1991 / pp. 181 - 187 / 2nd Conference in AI, Simulation and Planning in High Autonomy Systems

Event Based Planning

D. Kieronska, C. P. Tsang, S. Venkatesh

1991 / AI Approaches to Production Planning: Master Scheduling for Sequencing Tools Workshop at International Joint Conference on Artificial Intelligence (IJCAI)

An Occultation Based Motion Segmentation Technique

M. Corbett, S. Venkatesh, J. Cooper

1991 / Dynamic Scene Understanding Workshop, International Joint Conference on Artificial Intelligence (IJCAI)

Early Jump-out Corner Detectors

J. Cooper, S. Venkatesh, L. Kitchen

1991 / pp. 688 - 689 / IEEE Computer Society Conference on Computer Vision and Pattern Recognition

The Dissimilarity Corner Detector

J. Cooper, S. Venkatesh, L. Kitchen

1991 / pp. 1377 - 1382 / 5th International Conference on Advanced Robotics: Robots in Unstructured Environments

Texture Factorization: Variant and Invariant Description

S. Venkatesh, L. Kitchen

1990 / pp. 639 - 652 / AI 1990: 4th Australian Joint Conference on Artificial Intelligence

On the Classification of Image Features

S. Venkatesh, R. Owens

1990 / Vol. 11, pp. 339 - 349 / Pattern Recognition Letters

A Robust Scheme for Isolating and Classifying Visual Features

R. Owens, S. Venkatesh

1989 / pp. 664 - 679 / International Conference on ArtificiaI Intelligence in Industry and Government

Edge Detection Is a Projection

R. Owens, S. Venkatesh, J. Ross

1989 / Vol. 9, pp. 233 - 244 / Pattern Recognition Letters